Datasheet NCP1729 (ON Semiconductor) - 4

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NCP1729
0.0 100 Figure 14 Test Setup Figure 14 Test Setup T T −1.0 Vin = 2.0 V A = 25°C 90 A = 25°C Vin = 5.0 V AGE (V) −2.0 80 T Vin = 3.3 V −3.0 70 Vin = 5.0 V V −4.0 60 in = 3.3 V , OUTPUT VOL Vin = 1.5 V Vin = 2.0 V outV −5.0 50 −6.0 , POWER CONVERSION EFFICIENCY (%) 40 0 10 20 30 40 50 0 10 20 30 40 50 I I out, OUTPUT CURRENT (mA) out, OUTPUT CURRENT (mA)
Figure 8. Output Voltage vs. Output Current Figure 9. Power Conversion Efficiency vs. Output Current
Figure 14 Test Setup A) 1.75 Vin = 3.3 V RL = 10 k Iout = 5.0 mA 1.50 SHDN = GND Vin = 5.0 V TA = 25°C 1.25 Y CURRENT ( . AC COUPLED Vin = 3.3 V 1.00 AGE RIPPLE AND T 0.75 Vin = 1.5 V 0.50 OUTPUT VOL , SHUTDOWN SUPPL NOISE = 10 mV / Div 0.25 I SHDN −50 −25 0 25 50 75 100 TIME = 10 s / Div. TA, AMBIENT TEMPERATURE (°C)
Figure 10. Output Voltage Ripple and Noise Figure 11. Shutdown Supply Current vs. Ambient Temperature
5.0 SHDN = 5.0V/Div. TA = 25°C 4.5 Vin = 5.0 V RL = 1.0 k 4.0 TA = 25°C AGE (V) T Low State, 3.5 Device Shutdown Y VOL 3.0 High State, Device Operating 2.5 , SUPPL inV 2.0 AKEUP TIME FROM SHUTDOWN W Vout = 1.0 V/Div. 1.50.5 1.0 1.5 2.0 2.5 3.0 TIME = 400 V s / Div. th(SHND), SHUTDOWN INPUT VOLTAGE THRESHOLD (V)
Figure 12. Supply Voltage vs. Shutdown Input Figure 13. Wakeup Time From Shutdown Voltage Threshold http://onsemi.com 4