High Temperature, Low Drift, Micropower, 2.5V Reference
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12 /4 — ADR225. Data Sheet. ABSOLUTE MAXIMUM RATINGS. 100k. Table 2. Parameter. …
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ADR225. Data Sheet. ABSOLUTE MAXIMUM RATINGS. 100k. Table 2. Parameter. Rating. 10k. our. ( E. TIM. LIFE. 100. IC D. E R P. 120. 130. 140. 150. 160. 170. 180
ADR225Data SheetABSOLUTE MAXIMUM RATINGS100kTable 2. ParameterRating)10k Supply Voltage −0.3 V to +18 V sour OUTPUT to GND −0.3 V to V H S + 0.3 V ( E Storage Temperature Range −65°C to +150°C 1kTIM Operating Temperature Range LIFE 8-Lead SOIC −40°C to +175°C D100TE 8-Lead FLATPACK −40°C to +210°C IC D Junction Temperature Range E R P10 8-Lead SOIC −40°C to +200°C 8-Lead FLATPACK −40°C to +245°C Lead Temperature (Soldering 60 sec) 300°C 1120130140150160170180190200210 021 Stresses above those listed under Absolute Maximum Ratings OPERATING TEMPERATURE (°C) 11525- may cause permanent damage to the device. This is a stress Figure 2. Predicted Lifetime vs. Operating Temperature rating only; functional operation of the device at these or any THERMAL RESISTANCE other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute θJA is specified for worst-case conditions; that is, θJA is specified maximum rating conditions for extended periods may affect for the device soldered in the circuit board. device reliability. Table 3.PREDICTED LIFETIME vs. OPERATINGPackage TypeθJAθJCUnitTEMPERATURE 8-Lead SOIC 121 43 °C/W Comprehensive reliability testing is performed on the ADR225. 8-Lead FLATPACK 100 15 °C/W Product lifetimes at extended operating temperature are obtained using high temperature operating life (HTOL). Lifetimes are ESD CAUTION predicted from the Arrhenius equation, taking into account potential design and manufacturing failure mechanism assumptions. HTOL is performed to JEDEC JESD22-A108. A minimum of three wafer fab and assembly lots are processed through HTOL at the maximum operating temperature. Comprehensive reliability testing is performed on all Analog Devices, Inc., high temperature (HT) products. Rev. B | Page 4 of 12 Document Outline Features Applications Pin Configuration General Description Table of Contents Revision History Specifications Electrical Characteristics Absolute Maximum Ratings Predicted Lifetime vs. Operating Temperature Thermal Resistance ESD Caution Typical Performance Characteristics Theory of Operation Basic Voltage Reference Connections Outline Dimensions Ordering Guide