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Datasheet OP27 (Analog Devices) - 10

ПроизводительAnalog Devices
ОписаниеLow Noise, Precision Operational Amplifier
Страниц / Страница13 / 10 — STANDARD. 5962-94680. MICROCIRCUIT DRAWING
Формат / Размер файлаPDF / 113 Кб
Язык документаанглийский

STANDARD. 5962-94680. MICROCIRCUIT DRAWING

STANDARD 5962-94680 MICROCIRCUIT DRAWING

Operational Amplifier, 1 Func, 25uV Offset-Max, BIPolar, MBCY8
Кремний
Россия и страны СНГ
OP27AJ/QMLR 5962R9468002VGA A J
Analog Devices
по запросу
HXD Co.
Весь мир
5962R9468002VGA
Analog Devices
по запросу
Augswan
Весь мир
5962R9468002VGA
Analog Devices
по запросу
LED-драйверы MOSO для индустриальных приложений

Модельный ряд для этого даташита

Текстовая версия документа

TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4 1/ 1,2,3,4 1/ 1,2,3,4 1/ 2/ parameters (see 4.2) Group A test 1,2,3,4 1,2,3,4 1,2,3,4 requirements (see 4.4) Group C end-point electrical 1 1 1 2/ parameters (see 4.4) Group D end-point electrical 1 1 1 parameters (see 4.4) Group E end-point electrical --- --- 1,4 parameters (see 4.4) 1/ PDA applies to subgroup 1. 2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be completed with reference to the zero hour electrical parameters (see table I). TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. 1/ 2/ Parameter Device type Limit Delta Min Max VIO 02, 03 -135 +135 75 V IIB 02, 03 -70 +70 10 nA 1/ Deltas are performed at room temperature. 2/ 240 hour burn-in and 1,000 hour operating group C life test. 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
STANDARD
SIZE
5962-94680 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 F 10 DSCC FORM 2234 APR 97
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