Datasheet LTC2984 (Analog Devices) - 9

LTC2984
TYPICAL PERFORMANCE CHARACTERISTICS Diode Error and Repeatability vs Temperature Offset vs Temperature Noise vs Temperature
1.0 2.0 1.2 0.8 1.5 1.0 0.6 1.0 0.4 ) 0.8 0.2 V) 0.5 V RMS 0 0 0.6 ERROR (°C) –0.2 OFFSET (µ –0.5 NOISE (µ 0.4 –0.4 –1.0 –0.6 VDD = 5.25V 0.2 VDD = 5.25V –1.5 V –0.8 DD = 4.1V VDD = 4.1V VDD = 2.85V VDD = 2.85V –1.0 –2.0 0 –40 20 80 140 –50 –25 0 25 50 75 100 125 –50 –25 0 25 50 75 100 125 DIODE TEMPERATURE (°C) LTC2984 TEMPERATURE (°C) LTC2984 TEMPERATURE (°C) 2984 G19 2984 G20 2984 G21
One Shot Conversion Current vs ISLEEP vs Temperature Temperature VREFOUT V vs Temperature REFOUT vs T
60 16.0 2.5005 VDD = 5.25V VDD = 5.25V V 15.8 VDD = 4.1V 50 DD = 4.1V VDD = 2.85V 15.6 VDD = 2.85V 2.50025 15.4 40 15.2 (V) (µA) 30 (mA) 15.0 2.5 I SLEEP I IDLE 14.8 V REFOUT 20 14.6 2.49975 14.4 10 14.2 0 0 2.4995 –50 –25 0 25 50 75 100 125 –50 –25 0 25 50 75 100 125 –50 –30 –10 10 30 50 70 90 110 130 LTC2984 TEMPERATURE (°C) LTC2984 TEMPERATURE (°C) TEMPERATURE (°C) 2984 G22 2984 G23 2984 G24
Channel Input Leakage Current vs Adjacent Channel Offset Error vs Adjacent Channel Offset Error vs Temperature Temperature Input Fault Voltage (VDD = 5V) Input Fault Voltage
1.4 2.5 2.5 125°C 90°C 1.2 25°C 2.0 2.0 –45°C V) V) 1.0 1.5 1.5 0.8 1.0 1.0 0.6 0.5 0.5 INPUT LEAKAGE (nA) 0.4 CH2 OFFSET ERROR (µ CH2 OFFSET ERROR (µ 0 0 0.2 0 –0.5 –0.5 –1 0 1 2 3 4 5 6 4.95 5 5.05 5.1 5.15 5.2 5.25 5.3 5.35 0 –0.05 –0.1 –0.15 –0.2 –0.25 –0.3 –0.35 INPUT VOLTAGE (V) CH1 FAULT VOLTAGE (V) CH1 FAULT VOLTAGE (V) 2984 G25 2984 G26 2984 G27 2984fb For more information www.linear.com/LTC2984 9 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Complete System Electrical Characteristics ADC Electrical Characteristics Reference Electrical Characteristics Digital Inputs and Digital Outputs EEPROM Characteristics Typical Performance Characteristics Pin Functions Block Diagram Test Circuits Timing Diagram Overview Applications Information EEPROM Overview Eeprom Read/Write Validation EEPROM Write Operation EEPROM Read Operation Thermocouple Measurements Diode Measurements RTD Measurements Thermistor Measurements Supplemental Information Direct ADC Measurements Fault Protection and Anti-Aliasing 2- and 3-Cycle Conversion Modes Running Conversions Consecutively on Multiple Channels Entering/Exiting Sleep Mode MUX Configuration Delay Global Configuration Register Reference Considerations Custom Thermocouples Custom RTDs Custom Thermistors Package Description Revision History Typical Application Related Parts