Источники питания сетевого напряжения на DIN-рейке MEAN WELL

Datasheet AD625 (Analog Devices) - 9

ПроизводительAnalog Devices
ОписаниеProgrammable Gain Instrumentation Amplifier
Страниц / Страница11 / 9 — STANDARD. 5962-87719. MICROCIRCUIT DRAWING
Формат / Размер файлаPDF / 71 Кб
Язык документаанглийский

STANDARD. 5962-87719. MICROCIRCUIT DRAWING

STANDARD 5962-87719 MICROCIRCUIT DRAWING

22 предложений от 15 поставщиков
Интегральные микросхемы Аналоговая техника — усилители — инструменты, ОУ (операционные), буферные
EIS Components
Весь мир
AD625KNZ
Analog Devices
1 360 ₽
LIXINC Electronics
Весь мир
AD625KNZ
Analog Devices
от 2 048 ₽
ЧипСити
Россия
AD625KNZ
Analog Devices
2 422 ₽
Элитан
Россия
AD625KNZ
Analog Devices
11 388 ₽
LED-драйверы MOSO для индустриальных приложений

Модельный ряд для этого даташита

Текстовая версия документа

TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters 1 (method 5004) Final electrical test parameters 1*, 2, 3 (method 5004) Group A test requirements 1, 2, 3 (method 5005) Groups C and D end-point 1 electrical parameters (method 5005) * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
SIZE
A 5962-87719 MICROCIRCUIT DRAWING
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990
F 9
DSCC FORM 2234 APR 97
Электронные компоненты. Скидки, кэшбэк и бесплатная доставка от ТМ Электроникс